摘要
探索了淬火态U-Ti合金的奥氏体晶界显示方法,并依据GB/T 6394—2002和GB/T21865—2008,利用光学金相图像分析仪测定了典型制备工艺下U-Ti合金的平均奥氏体晶粒度。结果表明:采用先将U-Ti合金在500℃保温1h进行晶界析出敏化处理,再使用体积分数为95%的磷酸溶液可以清晰完整地显示U-Ti合金的奥氏体晶界;平均晶粒面积法和截线法测得的U-Ti合金的晶粒度级别指数近似;以截线法作为仲裁法,典型制备工艺下U-Ti合金的奥氏体晶粒度级别指数为2.84±0.16,平均截距为(119.74±6.97)μm。
The method for revealing austenitic grain boundaries of U-Ti alloys was studied, and tbe average austenitic grain size of U-Ti alloys prepared by typical process was determined with image analysis software and metallographic microscope according to GB/T 6394- 2002 and GB/T 21865- 2008. The results show that electrolytic corrosion with 5% phosphoric acid solution combined with grain boundary sensitization treatment at 500 C for 1 h was appropriate technique for revealing the autenitie grain boundaries of U-Ti alloys. The grain size grade indexes of U-Ti alloys obtained by average grain interception method and area method were similar. With interception method as the arbitration method, the austenitic grain size degree index of U-Ti alloys prepared by typical process was 2.84±0. 16, and the mean lineal intercept length was （119.74±6.97） μm.
出处
《理化检验（物理分册）》
CAS
2013年第4期229-232,共4页
Physical Testing and Chemical Analysis(Part A:Physical Testing)
基金
中物院资助项目(JK070102-3)
关键词
U—Ti合金
奥氏体晶粒度
晶界析出敏化法
截距法
面积法
U-Ti alloy
austenitic grain size
grain boundary sensitization treatment method
interception rnethod
area method
