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基于游程编码的测试数据压缩方法分析 被引量：2

Analysis of Test Data Compression Method Based on Run-Length Coding
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摘要 基于游程编码的测试数据压缩方案能够有效地压缩测试数据。文中介绍了4种经典的游程编码方案,并对它们的压缩率进行了比较。 The test data compression scheme based on run-length coding can compress test data efficiently. The paper introduces four classic compression schemes based on run-length, and compares the compression ratio with each other.
作者 刘娟 黄忠
机构地区 安庆师范学院
出处 《廊坊师范学院学报（自然科学版）》 2013年第2期65-67,共3页 Journal of Langfang Normal University(Natural Science Edition)
基金 安庆师范学院青年科研基金(201105)
关键词 测试数据压缩 变长-变长的编码 测试源划分 系统芯片 test data compression variable- to-variable-length codes test resource partitioning system-on-a-chip
分类号 TP391.76 [自动化与计算机技术—计算机应用技术]
  • 相关文献

参考文献5

  • 1A. Jas, J. Ghosh-Dastidar, Ng Mom-Eng and N.A. Touba. An efficient test vector compression scheme using selective huffman coding. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2003, 22 (6) : 797 - 806.
  • 2A. Jas and N. A. Touba. Test vector decompression via cy- clical scan chains and its application to testing core-based designs. Proceedings of IEEE International Test Confer- ence, 1998:458 - 464.
  • 3A. Chandra and K. Chakrabarty. System-on-a-chip test data compression and decompression architectures based on Golomb codes. IEEE Transactions on Computer-Aided De- sign of Integrated Circuits and Systems, 2001,20 (3) : 355 - 368.
  • 4A. Chandra and K. Chakrabarty. Test data compression and test resource partitioning for system-on-a-chip using fre- quency-directed run-length (FDR) codes. IEEE Transac- tions on Computers, 2003,52 (8) : 1076 - 1088.
  • 5刘娟,欧阳一鸣,梁华国.基于连续和交替序列编码的测试数据压缩[J].计算机工程,2010,36(1):274-276. 被引量：6

二级参考文献7

  • 1Li Lei, Chakrabarty K. Test Data Compression Using Dictionaries with Fixed-length Indices[C]//Proc. of the 21st IEEE VLSI Test Symposium. Washington D. C., USA: [s. n.], 2003.
  • 2Chandra A, Chakrabarty K. System-on-a-Chip Test Data Compression and Decompression Architectures Based on Golomb Codes[J]. IEEE Transactions on CAD of Integrated Circuits and Systems, 2001, 20(3): 355-368.
  • 3Chandra A, Chakrabarty K. Test Data Compression and Test Resource Partitioning for System-on-a-Chip Using Frequency- Directed Run-length(FDR) Codes[J]. 1EEE Transactions on Computers, 2003, 52(8): 1076-1088.
  • 4Gonciari P T, Al-Hashimi B M, Nicolici N. Variable-length Input Huffman Coding for System-on-a-Chip Test[J]. IEEE Transactions on CAD of Integrated Circuits and Systems, 2003, 22(6): 783-796.
  • 5Zhan Wenfa, Liang Huaguo, Shi Feng, et al. Test Data Compression Scheme Based on Variable-to-fixed-plus-variable-length Coding[J]. Journal of Systems Architecture, 2007, 53(11): 877-887.
  • 6Hamzaoglu I, Patel J H. Test Set Compaction Algorithms for Combinational Cireuits[C]//Proc. of International Conference on CAD. Princeton, New Jersey, USA: [s. n.], 1998.
  • 7梁华国,蒋翠云.基于交替与连续长度码的有效测试数据压缩和解压[J].计算机学报,2004,27(4):548-554. 被引量：70

共引文献5

同被引文献20

引证文献2

二级引证文献2

廊坊师范学院学报（自然科学版）
2013年 第2期

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