期刊文献+

基于时空分离AFM微悬臂的模糊PID控制研究 被引量:4

Fuzzy PID Control of Micro-cantilever in AFM Based on Separation of Time-spatial
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摘要 针对原子力显微镜(AFM)微悬臂的柔性特征,提出了一种基于时空变量分离的模糊PID控制方法。由于AFM的微悬臂探针的运动精度非常高,对扰动很敏感,因而需建立微悬臂的分布参数系统模型。在保持柔性微悬臂的空间振动特性的基础上,将基于时空变量分离控制方法,结合鲁棒性强的模糊PID控制方法运用到AFM微悬臂探针的控制上,这样使控制器的设计不用考虑空间耦合的影响。通过实验仿真结果,这种方法有效地提高了AFM的微悬臂探针的控制性能和稳定性。 To meet the flexible characteristics of micro-cantilever in Atomic-Force-Microscope (AFM) , this paper puts forward a fuzzy PID control method based on the separation of time-spatial variables. Because the AFM micro-cantilever has the very high Kinematic Accuracy requirement, and is sensitive to disturbance, it's necessary to use distributed parameter system in cantilever model. By keeping the spatial vibration characteristics of AFM cantilever, the combination of two control methods is applied to the control of AFM cantilever. So it does not need to consider the effect of spatial coupling in designing controller. The simulation result has shown that the control accuracy of tip position is effectively improved by using this method.
出处 《控制工程》 CSCD 北大核心 2013年第3期456-459,465,共5页 Control Engineering of China
基金 国家自然科学基金资助项目(51175519) 中南大学博士后基金资助项目
关键词 原子力显微镜 微悬臂 分布参数系统 模糊PID atomic force microscope micro-cantilever distributed parameter system fuzzy PID
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参考文献15

  • 1Garcia R, Paulo A S. Attractive and repulsive tip-sample interac- tion regimes in tapping-mode atomic force microscopy[ J ]. Physical Review B, 1999,60 (7) ,4961-4697.
  • 2Schitter G,Stemmer A,Allgower F. Robust 2 DOF-control of a pie- zoelectric tubescanner for high speed atomic force microscopy [ J ]. Proceedings of the American Control Conference, 2003,5,3720- 3725.
  • 3Sebastian A, SalaPaka M V, Clevelan J P. Robust Control Ap- proach to Atomic Force Microscopy [ J]. Proceedings of the 42nd IEEE Conference on Decision and Control,2003,4,3443-3444.
  • 4Schitter G, Menold P, Knapp H F, ect. High performance feedback for fast scanning atomic force microscopes[ J]. Review of Scientiew of Scientific Instruments ,2001,72 ( 8 ) ,3320-3327.
  • 5Lee S I,Howell S W,Raman A,etc. Nonlinear dynamics of micro- cantilevers in tapping mode atomic force microscopy:A comparison between theory and experiment [ J ]. Physical Review B,2002,66, 115409,1-10.
  • 6肖增文,赵学增,李洪波.AFM轻敲模式中微悬臂振动的研究[J].振动与冲击,2006,25(5):183-185. 被引量:4
  • 7Stark R W, Schitter G, Stark M, etc. State-space model of freely vi- brating and surface-coupled cantilever dynamics in atomic force mi- croscopy[ J]. Physical Review B (Condensed Matter and Materials Physics) ,2004,69(8),85412-1-9.
  • 8Ray W H. Advanced Process Control[ M]. Butterworths. 1989.
  • 9Zhang J B, Xi N, Li G Y. Adaptable End Effector for Atomic Force Microscopy Based Nanomanipulation [ J ]. IEEE Transactions on Nanotechnology, 2006,5 ( 6 ) ,628 -642.
  • 10Zhang J B,Li G. Y,Xi N. Modeling and Control of Active End Ef- fector for the AFM Based Nano Robotic Manipulators[J]. Robotics and Automation,2005. ICRA 2005. Proceedings of the 2005 IEEE International Conference on,2005,163-168.

二级参考文献4

  • 1[日]中川绘制等著,夏生荣译.工程振动学[M].上海:上海科学技术出版社,1981(10),127—138.
  • 2WinJin Chang, Te - Hua Fang, Huann - Ming Chou. Effect of interactive damping on sensitivity of vibration modes of rectangular AFM cantilevers[J]. Physics Letters A. 2003, 312:158-165.
  • 3Arturas Ulcinas, Valentinas Snitka. Intermittent contact AFM using the higher modes of weak cantilever[J]. Ultramicroscopy.2001, 86:217-222.
  • 4韩瑞珍,陈国定,杨马英.基于模糊推理的自整定PID控制器[J].基础自动化,2002,9(2):38-40. 被引量:21

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