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基于三维色彩空间的表观检测照明评价方法 被引量:2

Illumination Assessment Method Based on Three-Dimensional Color Space for Automatic Visual Inspection
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摘要 针对表观检测系统中照明效果评价和优化较困难的问题,分析了印刷电路板表观图像及其在三维色彩空间中的像素值分布,提出基于三维色彩空间的照明效果评价方法,以量化的色彩分离程度、像素值波动程度和缺陷色彩偏离程度来建立评价函数。实验结果表明,此方法可有效地量化照明效果并符合人眼视觉感受,量化的精度优于1%,根据评价函数进行照明优化可达到对于该电路板的适配照明效果。本方法也可用于类似的表观缺陷检测,如印刷质量检测和塑料产品缺陷检测。 Assessment and optimization of illumination are difficult issues in automatic visual inspection. Atter analyzing the images of visual inspection of printed circuit boards and their pixel value distribution in threedimensional color space, an illumination assessment method is proposed. This merit function is based on quantitative analysis of Euclidean distance of color in red-green-blue (RGB) space, fluctuation extent of pixel value and deviation of defect color. The experimental results show that this method is suitable for evaluating the illumination effect and complies with subjective feeling of human visual system. It is also shown that the precision is better than 1%. An illumination optimization experiment is performed and the optimum lighting effect is obtained based on the merit function. This method can be applied to other visual inspection areas, such as color print quality inspection and plastic product defects inspection.
出处 《光学学报》 EI CAS CSCD 北大核心 2013年第5期177-182,共6页 Acta Optica Sinica
基金 国家自然科学基金(61205004)资助课题
关键词 机器视觉 照明评价方法 照明优化 电路板检测 表观缺陷检测 machine vision illumination assessment method illumination optimization printed circuit board defectinspection automatic visual inspection
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  • 1R. M. Wasserman, A. D. Silber. Optimization of multiple-source illumination for machine vision inspection via visual simulation [C]. SPIE, 2002, 4772: 37-46.
  • 2W. Zhou, A. C. Bovik, H. R. Sheikh et al.. Image quality assessment: from error visibility to structural similarity [J]. IEEE Trans. Image Processing, 2004, 13(4): 600-612.
  • 3A. Ibrahim, S. Tominaga, T. Horiuchi. Material classification for printed circuit boards by spectral imaging system [J]. LNCS, 2009, 5646: 216-225.
  • 4B. M. Barnes, R. Quinthanilha, Y. Sohn et al.. Optical illumination optimization for patterned defect inspection [C]. SPIE, 2011, 7971: 79710D.
  • 5N. Ko, Y. Lee, S. Jung et al.. Computational imaging in machine vision system for automated optical inspection [C]. Computational Optical Sensing and Imaging, 2009. JTuC13.
  • 6袁江涛,杨立,王小川,张健,金仁喜.基于机器视觉的细水雾液滴尺寸测量与分析[J].光学学报,2009,29(10):2842-2847. 被引量:17
  • 7R. Gruna, J. Beyerer. Feature-specific illumination patterns for automated visual inspection [C]. IEEE International Instrumentation and Measurement Technology Conference, 2012. 360-365.
  • 8向守兵,苏光大,陈健生,刘京,谭孝辉.基于机器视觉的码坯异常检测与识别[J].光学学报,2011,31(7):184-190. 被引量:12
  • 9张习文,王晓东,罗怡,滕霖,陈亮.精密微小型零件自动装配系统显微机器视觉的照明自动优化[J].光电工程,2012,39(4):14-20. 被引量:9
  • 10张学武,丁燕琼,闫萍.一种基于红外成像的强反射金属表面缺陷视觉检测方法[J].光学学报,2011,31(3):104-112. 被引量:28

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