基于IEEE 1149.4标准的参数测试系统的设计

Design of Parametric Test System Based on IEEE1149.4

为了实现对混合信号电路的参数测试,本文提出一种以FPGA为主控器的基于IEEE 1149.4标准的参数测试系统。实验结果表明,该系统符合IEEE 1149.4标准的基本要求,测试准确。该测试系统的设计为IEEE 1149.4标准提供了一种实现方法,可扩展性强,为更好的解决混合电路测试打下了良好的基础。

In order to test mixed-signal circuits, the present study proposes a parametric test system based on IEEE 1149.4 standard in which FPGA is used as the controller. The results show that the proposed system meets the basic requirements of the IEEE1149.4 standard as well as makes test accurate. Therefore the design of this test system provides an exlensible way to realize IEEE1149.4 standard, which can be an important foundation for better solutions Io the mixed-signal circuit test.