H^+质子化对壳聚糖膜材动态力学行为的影响

Influence of Protonation on Dynamic Mechanical Behavior of Chitosan Solid Film

以流延法制备H+质子化壳聚糖和中性壳聚糖膜材,在-100～345℃范围用动态机械热分析仪(DMTA)研究H+质子化壳聚糖膜材动态储能模量E'、动态损耗模量E″和力学损耗因子tanδ的温度谱和频率谱,结合X射线、红外光谱、扫描电镜和热重差热分析,探讨H+质子化对壳聚糖膜材动态力学行为及其热稳定性的影响.

The protonation and deprotonation chitosan solid films were method. The two kinds of films microstructure and physical-chemical changes prepared by solution have been character- ized by scanning electron microscopy （SEM）, X ray diffraction （XRD）, the thermal gravimeric a- nalysis （TG） and differential scanning calorimetry （DSC）. Dynamic mechanical thermal analysis （DMTA） was used to measure the temperature spectra of the dynamic storage modulus （E＇）, dy- namic loss modulus （E＂） and the mechanical loss tangent （tan 8） for investigating the protonation influence on the dynamic mechanical behavior and mechanical property thermal stability of the chi- tosan solid film between - 100 - 345 ℃.