周期性样品PSTM消假像数值模拟

Numerical simulation of periodic sample to reduce false image in photon scanning tunneling microscopy

以微扰方法为基础 ,利用双光束照射周期性样品消除由形貌引起的假像 .给出了 0 -方位和π-方位照射下 s-极化和 p-极化在玻璃光栅上等强度和等高度扫描模式下的近场强度图像 .通过比较得到了较好的结果 ,并讨论了各种参数如极化和针尖与样品之间的距离对光子扫描隧道显微镜图像的影响 .

False image is reduced by using two beams illuminating a periodic sample based on a perturbation method. The intensity maps are presented by using lighting beams at 0 azimuth and π azimuth in s polarization and p polarization, and in constant intensity scanning mode and in constant height scanning mode respectively. By contrast, the better results are obtained, and the influences of various parameters such as polarization and tip sample distance on PSTM image are discussed. The experimental results can well show the true surface topography.