小麦旗叶衰老过程中石蜡切片的扫描电镜观察

Observation of Paraffin Section of the Flag Leaf of Wheat By SEM During Senescence

对小麦旗叶衰老过程中的石蜡切片进行扫描电镜观察 ,结果表明 ,( 1 )旗叶衰老过程中 ,细胞核形态发生明显变化。即核呈球形 ,表面光滑 ,核孔匀称→核表面凸凹 ,部分核孔变大→核膜破裂 ,核解体 ,消失 ;( 2 )在籽粒成熟期小麦旗叶衰老及其细胞器退化消失明显加快 ;( 3 )细胞中叶绿体的退化、消失比线粒体稍快 ;( 4)

The paraffin section of the flag leaf of wheat during its senescence was observed with SEM.The results showed: 1) during the senescence of wheat, the nuclear shape altered obviously. Round, smooth nuclear surface, and uniform nuclear pore changed into bumping surface and expanding nuclear pore, then the nuclei broken and disappeared; 2) the degenerate and disappear of cell organelle and senescence of the flag leaf were obviously faster during the ripe of grain; 3) the degenerate and senescence of chloroplast was faster than that of mitochondria; 4) The nuclear of leaf cells broken and disappeared faster than that of the leaf bumdles.