电阻阵列非均匀性测试与校正

Resistor Array Nonuniformity Measurement and Correction

电阻阵列红外图像投射器的研究在近20年间取得了突破性的进展。作为红外图像生成系统的关键部件,电阻阵列的非均匀性是影响红外图像质量的主要因素,电阻阵列在使用之前必须进行非均匀性校正才能满足红外图像生成系统的应用要求。给出了非均匀性校正的流程;针对稀疏网格法和全屏测试法的互补性,提出了改进的全屏测试法;采用3次样条插值和分段线性法进行数据处理;采用"在线查表法"进行实时非均匀性校正。仿真结果表明,改进的全屏测试法及非均匀性实时算法取得了良好的效果。

The research on resistor array based on infrared （IR） projectors has been greatly improved during the recent 20 years. As the key device of the infrared scene generation system, the resistor array＇s nonuniformity is the main impact factor on the performance of the infrared image, and it must be corrected before used in order to satisfy the need of the infrared scene generation system. The nonuniformity correction flow is investigated in detail; the improved flood measurement is proposed to complement sparse grid and flood approach; the data-processing based on cubic spline interpolation and piecewise linearization is introduced; the real-time nonuniformity correction based on ＂online look-up-tables＂ is proposed. The simulation shows that the methods achieve excellent results.