期刊文献+

电荷耦合器件饱和效应对PIE成像质量的影响 被引量:5

Influence of Charge Coupled Device Saturation on PIE Imaging
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摘要 在研究电荷耦合器件(CCD)饱和效应对PIE成像质量影响的基础上,提出了一种改进的重建算法。该方法可以从发生部分饱和的数据重建出准确的再现像。和现有的方法相比,此方法可以在保证分辨率不受影响的条件下,大幅度缩短数据采集时间,因此可显著降低对实验装置和样品稳定性的要求,对PIE方法的推广应用有重要的实际意义。 Based on the analysis of the influence of the charge coupled device (CCD) saturation on the image quality of ptychographical iterative engine (PIE), an improved reconstruction algorithm is proposed to get accurate reconstruction from partially saturated data. Compared with the common algorithm, the suggested method can remarkably reduce the data acquisition time without degrading the spatial resolution of the reconstruction, so the requirement on the stability of the experimental setup and the specimen is obviously reduced, and this method is quite meaningful for a wide range of applications of PIE.
出处 《光学学报》 EI CAS CSCD 北大核心 2013年第6期65-70,共6页 Acta Optica Sinica
基金 江苏省自然科学基金(BK2012548)资助课题
关键词 成像系统 相干衍射成像 相位恢复 显微成像 PIE imaging systems coherent diffraction imaging phase retrieval microscopic imaging PIE
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参考文献15

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共引文献3

同被引文献59

  • 1张静娟,史祎诗,司徒国海.光学信息隐藏综述[J].中国科学院研究生院学报,2006,23(3):289-296. 被引量:13
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  • 10A M Maiden, J M Rodenburg, et al..Improved ptychographical phase retrieval algorithm for diffractive imaging [J].Ultramicroscopy, 2009, 109(10): 1256-1262.

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