摘要
For a three-port angle-tuned thin film filter, the characteristic of reflected-port is very important to reflect multiple wavelengths spectrum. As the filter is in tilted incidence, the reflected-facula broadens and the refiectivity decreases. In this paper, we proposed a frequency recursive algorithm based on fast Fourier transform and Fresnel formula. The reflected-intensity distribution of the narrow- band filter from normal incidence to 40~ tilted incidence was simulated by this frequency recursive algorithm. Meanwhile, the beam field experiments were accordingly performed in this study. Compared with the traditional beam spatial superposition method, the frequency recur- sive algorithm is more efficient and precise in calculating the reflectivity of the reflected beam, suggesting the frequency recursive algorithm may be more helpful for fabricating the three-port tunable thin film filter.
For a three-port angle-tuned thin film filter, the characteristic of reflected-port is very important to reflect multiple wavelengths spectrum. As the filter is in tilted incidence, the reflected-facula broadens and the refiectivity decreases. In this paper, we proposed a frequency recursive algorithm based on fast Fourier transform and Fresnel formula. The reflected-intensity distribution of the narrow- band filter from normal incidence to 40~ tilted incidence was simulated by this frequency recursive algorithm. Meanwhile, the beam field experiments were accordingly performed in this study. Compared with the traditional beam spatial superposition method, the frequency recur- sive algorithm is more efficient and precise in calculating the reflectivity of the reflected beam, suggesting the frequency recursive algorithm may be more helpful for fabricating the three-port tunable thin film filter.
基金
This work was supported by the National Natural Science Foundation of China （Grant No. 61205062） and the Nature Science Foundation of Hubei Province of China （No. 2012FFB02701 ）.
