摘要
LXI总线测试仪器及系统的新应用对时间同步精度提出了亚微秒甚至纳秒级的要求。本文分别从IEEE1588同步机制、时间戳的提取方式、测试系统的拓扑结构等方面进行研究,分析影响LXI总线测试仪器及系统时间同步精度的主要因素,提出了改进方法并通过试验验证,结果表明:同步以太网辅助IEEE1588时间同步机制、硬件提取时间戳、星型拓扑结构都可以有效地提高LXI总线测试仪器及系统的时间同步精度。
The clock synchronization accuracy of LXI instrument and system is required to achieve sub- microsecond or even nanosecond level in new applications. In order to satisfy the requirement, the IEEE 1588 precision clock synchronization mechanism, the generation of message timestamps and the topology of test system are researched in this paper. By analyzing the main factors affected clock synchronization accuracy, the improved methods are proposed and tested. The result shows that IEEE 1588 precision clock synchronization mechanism with synchronous Ethernet, hardware timestamp in PHY and star topology can effectively improve the clock synchronization accuracy of LXI instrument and system.
出处
《国外电子测量技术》
2013年第5期16-20,共5页
Foreign Electronic Measurement Technology
