摘要
随着待测芯片的集成度越来越高,IEEE1149.1标准已很难满足芯片设计对测试与调试的要求。IEEE1149.7标准在保持与IEEE1149.1兼容的基础上增加了新功能,提供了一种全新的双引脚测试与调试方法。目前对IEEE1149.7的研究处于起步阶段,所以研究支持其的控制器命令对今后的发展具有重要的意义。本文在深入研究IEEE1149.7标准的基础上,利用QuartusII开发平台设计了基于TAP控制器命令的测试控制器,并进行了仿真验证。结果表明产生的命令测试信号符合IEEE1149.7标准对TAP控制器命令的规定。
With the increasing integration of test chip,IEEE 1149. 1 has been difficult to meet the requirements of the chip testing and designing. Being compatible with IEEE 1149. 1, IEEE 1149.7 provides a new two-pin test and debug methods. Because IEEE 1149. 7 is still in the initial stage,to study its commands of controller is of great significance on the future development of IEEE 1149.7. This paper is based on the deep study of IEEE 1149. 7 standard,to design a test controller based on the commands of TAP controller by using QuartusII platform and perform simulation verification. The result shows that the test signal generated by the controller can meet the requirements of IEEE 1149.7.
出处
《国外电子测量技术》
2013年第5期41-43,56,共4页
Foreign Electronic Measurement Technology
