反平面变形下弱界面压电夹层结构的圣维南端部效应

SAINT-VENANT END EFFECT FOR ANTI-PLANE DEFORMATION OF PIEZOELECTRIC SANDWICH STRUCTURES WITH WEAK INTERFACES

研究了弱界面压电夹层结构在反平面变形下的圣维南端部效应。夹层结构的端部承受自平衡电弹载荷,上、下表面机械自由,但可以是电学短路或开路的。基于压电材料反平面变形的控制方程,利用边界和界面条件,得到了关于衰减率的特征方程。作为例子,给出了压电-弹性-压电和弹性-压电-弹性两种典型夹层结构的显式特征方程,并数值表明了界面性能、电边界条件和体积分数对衰减率的影响。

The decay of Saint-Venant end effect for the anti-plane deformation of a piezoelectric sandwich structure is paid attention to. The end of the sandwich structure is subjected to a set of self-equilibrated electro-elastic loads. The upper and lower surfaces of the sandwich structure are assumed to be traction-free and subjected to two kinds of electric boundary conditions, i.e. electrically short and electrically open. Based on the constitutive equation for anti-plane piezoelectricity and by using the boundary and interracial conditions, the characteristic equations for decay rate are derived. As examples, the explicit equations determining the decay rates are given for two types of the sandwich structures, i.e. piezoelectric-elastic-piezoelectric and elastic-piezoelectric- elastic ones. The numerical results show the effects of the electric boundary conditions, volume fraction and weak bonding on the decay rate.