高强度短寿命核素对其它峰计数率和半衰期影响的研究

The Effects of High-intensity Short-lived Nuclides on Count Rate and Half-life

利用HPGe探测器及DSPECPIus谱仪的活时间校准模式（LTC）和零死时间校准模式（ZDT），对含有高强度短寿命核素的混合样品作了测量。结果表明：在计数率急剧变化的情况下，LTC方法测得的峰计数经修正以后仍然存在计数丢失；与ZDT模式的数据相比，初始阶段数据丢失率约2．O％～3．8％。这部分不能正确修正的计数对短寿命核素的半衰期几乎没有影响，但是对半衰期相对较长的核素有一定的影响，实验中，LTC和ZDT两种模式下24Na的半衰期相差了2．56％。

Samples containing short - lived nuclides were measured with the two modes of Live - Time Clock （LTC） and Zero- Dead -Time counting （ZDT）. A counting- loss with the range of 2.0% to 3.8% is dis- covered when the count rate changed significantly at the initial phase. The counting- loss almost has no effect on the short - lived nuclides, but, it has some impact on longer half - life nuclides. The measurement results show that there has a difference of 2.56% to 24Na compare with LTC to ZDT mode.