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平均空位径向扩散通量对直拉硅单晶空洞演化影响的相场模拟 被引量:6

Phase-field Modeling of Void Dynamics during CZ Silicon Growth with Radial Vacancy Diffusion
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摘要 直拉硅单晶中空洞的大小和数目对其性能有着至关重要的影响.采用已有的与晶体生长温度场有限元模型相耦合的空洞演化相场模型及其应用程序,模拟研究了不同的平均径向扩散通量对直拉单晶硅生长过程中空洞形貌及其分布状态演化的影响规律.结果表明:平均空位径向扩散通量的变化对于空洞演变阶段性及其形貌特征影响不大;随着平均空位径向扩散通量的增加,空洞的孕育阶段缩短,形核长大阶段延长,空洞平均尺寸及分数增加. The number and the size of voids have great influence on the quality of CZ silicon crystal. In this paper, an existing phase field model of void evolution which couples with the crystal growth tempera-ture field infinite element model is used to simulate and study influences of different radial diffusion fluxes on the shape and distribution of voids in the growth of CZ silicon crystal. The results show.the change in radial diffusion fluxes has little influence on the phases of void evolution and shapes of voids; with the in-crease of radial diffusion fluxes, the incubation stage will be shortened, the nucleation stage prolonged, the void fraction and diameters increased.
出处 《徐州工程学院学报(自然科学版)》 CAS 2013年第2期41-45,共5页 Journal of Xuzhou Institute of Technology(Natural Sciences Edition)
基金 高等学校博士学科点专项科研基金(200804220021)
关键词 单晶硅 直拉法 空洞 空位径向扩散通量 相场模拟 silicon crystal Czochralski process void radial diffusion fluxes phase field modeling
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  • 1徐岳生,刘彩池,王海云,张维连,杨庆新,李养贤,任丙彦,刘福贵.磁场直拉硅单晶生长[J].中国科学(E辑),2004,34(5):481-492. 被引量:13
  • 2Dornberger E, Temmler Dvvon Ammon W. Defects in silicon crystals and their impact on DRAM device characteristics[]]'Journal of the Electrochemical Society,2002, 149(4): 226-231.
  • 3Voronkov V V. The mechanism of swirl defects formation in silicon[]].Journal of Crystal Growth,1982,59(3) :625-643.
  • 4Sinno T, Brown R A, von Ammon W, et al. Point defect dynamics and the oxidation induced stacking-fault ring in Czochrals?ki-grown silicon crystals[J].Journal of the Electrochemical Society, 1998,145(1) : 302-318.
  • 5Sinno T,Susanto H,Brown R Av et al. Boron retarded self-interstitial diffusion in Czochralski growth of silicon crystals and its role in oxidation-induced stacking-fault ring dynamics[] J. Applied Physics Letters, 1999,75 (11) : 1544-1546.
  • 6Mori T. Modeling the linkages between heat transfer and microdefect formation in crystal growth: examples of Czochralski growth of silicon and vertical Bridgman growth of bismuth germanatej D], Massachusetts: Massachusetts Institute of Tech?nology,2000.
  • 7Yu X, Yang D,Ma Xvet al. Effect of rapid thermal process on oxygen precipitation and denuded zone in nitrogen-doped sili- con wafers[J]. Microelectronic Engineering, 2003,69 (1) : 97-104.
  • 8郝秋艳,刘彩池,孙卫忠,张建强,孙世龙,赵丽伟,张建峰,周旗钢,王敬.高温快速退火对重掺锑硅单晶中流动图形缺陷的影响[J].物理学报,2005,54(10):4863-4866. 被引量:3
  • 9曾庆凯.直拉硅单晶中微缺陷演变的相场模拟研究[D].济南:山东大学博士学位论文,2012.
  • 10曾庆凯,关小军,潘忠奔,张怀金,王丽君,禹宝军,刘千千.直拉单晶硅生长时空洞演化的相场模拟[J].人工晶体学报,2012,41(4):888-895. 被引量:11

二级参考文献71

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  • 1郭巍,宗亚平,左良,王云志.外加应变对Ti-25Al-10Nb合金显微组织影响的相场法模拟[J].金属学报,2006,42(5):549-553. 被引量:6
  • 2高宇,周旗钢,戴小林,肖清华.热屏和后继加热器对生长φ300mm硅单晶热场影响的数值分析[J].人工晶体学报,2007,36(4):832-836. 被引量:5
  • 3Kobayashi N. Hydrodynamics in Czochralski Growth-computer Analysis and Experiments[ J ]. Journal of Crystal Growth, 1981,58 ( 1 ) :425-434.
  • 4Kinney T, Bomside D, Brown R, el al. Quantitative Assessment of an Integrated Hydrodynamic Thermal-capillary Model fi)r Large-diameter Czochralski Growth of Silicon : Comparison nf Predic, ted Temperature Field with Experimenl[ J ]. Journal of Crystal Growth, 1993,126:413-434.
  • 5Liu L, Kakimoto K. Partly Three-dimensional Global Modeling of a Silicon Czochralski Furnace. Ⅲ. Model Application: Analysis of a Silicon Czochralski Furnace in A Transverse Magnetic Field [ J ]. Heat Mass Transfer,2005,48 ( 21 ) :4492-4497.
  • 6Domberger E, Tomzing E, Seidl A, et al. Thermal Simulation of the Czochralski Silicon Growth Process by Three Different Models and Comparison with Experimental Results [ J ]. Journal of Crystal Growth, 1997,180:461-467.
  • 7滕冉,戴小林,徐文婷,等.热屏底端位置对生长300mm硅单晶热场影响的数值模拟[C].第十七届全国半导体集成电路硅材料学术会议,2011:221-224.
  • 8Sabanskis A, Bergfelds K, Muiznieks A, et al. Crystal Shape 2D Modeling for Transient CZ Silicon Crystal Growth [ J ]. Journal of Crystal Growth, 2013.
  • 9Chung W T, Wu Y H, Chert Y C, et al. Investigation of the 22 Inch Hot Zone Simulation and Experiment of the CZ Silicon Crystal Growth Process[C]. Photovohaic Specialists Conference (PVSC) ,2011,37th IEEE. IEEE,2011:002142-002146.
  • 10Chen J C, Teng Y Y, Wun W T, et al. Numerical Simulation of Oxygen Transport during the CZ Silicon Crystal Growth Process[ J]. Journal of Crystal Growth ,2011,318( 1 ) :318-323.

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