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变频器过流故障原因分析及处理方法 被引量:3

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摘要 本文分析了变频器发生过流故障的各种原因,以及对变频器过流故障进行定位,并同时找出过流故障处理对策。
作者 黎振浩
出处 《中国新技术新产品》 2013年第12期173-174,共2页 New Technology & New Products of China
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参考文献3

  • 1张选正,等.变频器故障诊断与维修[M].北京:电子工业出版社.
  • 2周志敏,等.变频器工程应用·电磁兼容·故障诊断[M].北京:电工工业出版社.
  • 3李永忠,等.变频器与触摸屏应用技术易读通[M].北京:中国电力出版社.

同被引文献12

  • 1Yang S, Bryant A, Mawby P, et al. An industry- based survey of reliability in power electronic conver- ters[J]. Industry Applications, IEEE Transactions on, 2011, 47(3): 1441-1451.
  • 2Sonnenfeld G, Goebel K, Celaya J R. An agile acce- lerated aging, characterization and scenario simulation system for gate controlled power transistors[C]// AUTOTESTCON, 2008 IEEE. Salt Lake City, UT: IEEE, 2008: 208-215.
  • 3Buh G H, Chung H J, Kuk Y. Real-time evolution of trapped charge in a SiOz layer: an electrostatic force microscopy study[J]. Applied Physics Letters, 2001, 79(13): 2010-2012.
  • 4Lefebvre S, Khatir Z, Saint-Eve F. Experimental behavior of single-chip IGBT and COOLMOS devices under repetitive short-circuit conditions[J]. Electron Devices, IEEE Transactions on, 2005, 52(2): 276- 283.
  • 5Arab M, Lefebvre S, Khatir Z, et al. Experimental investigations of trench field stop IGBT under repeti- tive short-circuits operations[C]//Power Electronics Specialists Conference, 2008. Rhodes, Greece:IEEE, 2008: 4355-4360.
  • 6Pietranico S, Lefebvre S, Pommier S, et al. A study of the effect of degradation of the aluminium metalli- zation layer in the case of power semiconductor devices[J]. Microelectronics Reliability, 2011, 51 (9) : 1824-1829.
  • 7LinderS,肖曦,李虹.功率半导体——器件与应用[M],1版.北京:机械工业出版社,2009.
  • 8Berkani M, Lefebvre S, Khatir Z. Saturation current and on-resistance correlation during During repetitive short-circuit conditions on SiC JFET transistors[J]. IEEE Transactions on Power Electronics, 2013, 28 (2) : 621-624.
  • 9翟世宽,刘平.变频器过电流故障原因分析与处理[J].电工技术,2013(2):35-36. 被引量:3
  • 10周雒维,吴军科,杜雄,杨珍贵,毛娅婕.功率变流器的可靠性研究现状及展望[J].电源学报,2013,11(1):1-15. 被引量:65

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