基于并行频率测量的TCXO高效测试技术

A High-effective TCXO Test Method based on Parallel Frequency Measurement

当前的温补晶振测试系统受频率测量容量制约,测试效率不高,本文提出了一种基于直接测频法的并行频率测量方法,并采用该方法实现了并行TCXO测试系统。该测试系统已经可以对至少100颗TCXO同时进行测试,且测试容量还可以进一步增加。该测试系统的频率相对测量误差低于±4×10-9,完全符合目前TCXO的设计和生产精度要求。应用该并行测试系统可显著提高TCXO测试与生产的效率。

The present TCXO test systems are of low test efficiency because of limited frequency measurement capacity. A parallel frequency measurement method based on directly frequency measure- ment is proposed in this paper and a parallel TCXO test system using this method was developed. At least 100 TCXOs can be measured simultaneously in the proposed test system, and its test capacity can be ex- panded further. Its frequency measurement error is less than ±4×10^-9 fully meeting the accuracy require- ment of the design and production of state-of-the-art TCXOs. The test and production efficiency of TCXOs can be raised using this test system.