一种生丝颣节电子检验系统的设计

The Design of Electronic Inspection System for Defects of Raw Silk

设计了一套生丝颣节电子检验系统,主要包括基于硅光电池的光电传感器、差分放大电路,以及采用LabVIEW语言编写的信号采集和数据处理程序。为保证采集到的颣节信号尽量不失真,该系统对于信号的工频干扰及其谐波干扰采用了自适应相关模板法进行处理,高频干扰及白噪音干扰采用了三次样条拟合处理。经验证,该系统在单次采样长度为0.2 mm的条件下,可满足生丝运行速度在20 m/s及以下输出生丝颣节近似波形的效果要求,测试精度为3μm,具有检验效率高和检验精度高的优点,在后续研究中根据生丝颣节电子检验标准进行完善后,可在保证检验结果准确性的基础上大大提高生丝颣节的检验效率。

This paper presents the design of a set of electronic inspection system for defects of raw silk, mainly including the photoelectric sensor based on silicon photocell, differential amplification circuit as well as signal acquisition and date processing programs written with LabVIEW language. In order to make sure defect signals collected are distortionless, this system adopts adaptive coherent model for signal power frequency interference and harmonic interference and adopts cubic spline fitting treatment for high-frequency interference and white noise disturbance. Through verification, this system can satisfy the effect requirement of outputting approximate wave form of raw silk defects when the operating speed of raw silk is 20 m/s and below under the condition of single sampling length of 0.2 mm. The test accuracy is 3 p,m. This system has the advantages of high inspection efficiency and high inspection precision. After perfected in follow-up studies, according to electronic inspection standards of raw silk defects, it can greatly improve inspection efficiency of raw silk defects on the basis of ensuring the accuracy of inspection result.