基于ZnO纳米线的圆柱形微纳米跨尺度结构的制备与表征

Preparation and Characterization of a ZnO Nanowires-based Cylindrical Hierarchical Structure

基于水浴法在光纤纤芯上合成了ZnO纳米线,得到了圆柱形微纳米跨尺度结构.将纳米级的随机粗糙表面叠加到微米级的圆柱形基底上,实现了对圆柱形跨尺度结构表面形貌的仿真分析.采用扫描电子显微镜(SEM)并结合Matlab图像处理算子对跨尺度结构的表面形貌和ZnO纳米线的几何特征参数进行了表征.与ZnO纳米线薄膜实际轮廓提取出的特征参数相同,对均方根粗糙度为39.2 nm、偏斜度为0.1324及峭度为2.7146的圆柱形粗糙表面进行了仿真,验证了仿真表面与实际轮廓的一致性.建立了合成工艺参数对ZnO纳米线的长度、直径及长径比等几何特征参数的影响关系,确定最佳工艺条件为:种子层溶液Zn2+浓度为1.0 mmol/L,生长液Zn2+浓度为0.03 mol/L,生长时间为1.5 h,水浴恒温90℃.

ZnO nanowires were synthesized with hydrothermal method on an optical fiber core, hence generating a cylindrical hierarchical structure. With a rough surface superimposed on a cylindrical substrate, the morphology of this hierarchical structure was simulated and investigated. SEM images along with relative operators of MatLab software were employed to characterize the morphology of the hierarchical structure and the geometric parameters of ZnO nanowires. Characteristic parameters including root mean square（RMS） roughness, skewness and kurtosis of the line edge profile of ZnO nanowires film were extracted respectively as 39.2 nm, 0.1324 and 2.7146, whilst the surface morphology of the cylindrical hierarchical structure with same values of characteristic parameters were simulated. It was concluded that the properties of the line edge profile were in agreement with that of the simulated surface. Also the effects of the synthesizing parameters on the geometric properties of ZnO nanowires were investigated, resulting in a group of ideal synthesizing parameters as 1.0 mmol/L Zn^2＋ concentration of the seed layer solution, 0.03 mol/L Zn^2＋ concentration of the growth solution, 1.5 h of the growth time and 90℃ of the growth temperature. The results can be used for not only the batch fabrication of this cylindrical hierarchical structure, but also the construction of related ZnO nanowires-based sensors in medical, biological, electrochemical and gas detection applications.