摘要
对多晶硅电池片焊带接口进行金相包埋,利用扫描电镜(SEM)表征,观察焊带与硅片结合处的图像及其成分分布,进而了解焊接情况,为工艺优化提供技术支撑.
The feature and composition distribution of the polysilicon cell welding zone, which is metallographically embedded, and silicon wafer is characterized by scanning electron microscopy to understand the welding condition, thus technical support is provided for the optimization of the process.
出处
《分析测试技术与仪器》
CAS
2013年第2期114-117,共4页
Analysis and Testing Technology and Instruments
关键词
太阳能电池
焊带
扫描电镜
solar cell
welding strip
scanning electron microscope
