期刊文献+

硅熔化特性的分子动力学模拟——不同势函数的对比研究 被引量:5

A comparative study of different potentials for molecular dynamics simulations of melting process of silicon
原文传递
导出
摘要 分别采用Stillinger-Weber(SW)势、修正的成熟原子嵌入模型(MEAM)势、Tersoff势和HOEP(highly optimized empirical potential)势来描述硅原子间相互作用,运用分子动力学方法对比模拟研究了四种势函数的硅晶体的体熔化和表面熔化特性.结果表明:四种势函数均能反映出硅的热膨胀、高温熔化和熔化时吸热收缩等基本物理规律.但综合对比发现,Tersoff势和MEAM势相对更适合描述硅的熔化和凝固过程,SW势次之,HOEP势则不适合描述硅的熔化和凝固过程. Molecular dynamic simulations of bulk melting and surface melting of Si are carried out. The atomic interactions in Si are calculated by stillinger-weber (SW), modified embedded-atom method (MEAM), Tersoff and highly optimized empirical potential (HOEP) potentials respectively. The results show that the four potentials could exhibit the fundamental laws of Si, such as thermal expansion, melting at high temperature, endothermic and volume shrinkage in melting process. However, the detailed analyses demonstrate that the Tersoff and MEAM potentials are best to describe the melting and crystal growth of Si, SW potential is the next. The HOEP potential is even unsuitable for describing the melting and crystal growth of Si.
出处 《物理学报》 SCIE EI CAS CSCD 北大核心 2013年第14期346-352,共7页 Acta Physica Sinica
基金 国家自然科学基金(批准号:51264032) 江西省自然科学基金(批准号:20114BAB206037)资助的课题~~
关键词 势函数 熔化 分子动力学 silicon potential function melting molecular dynamic
  • 相关文献

参考文献5

二级参考文献35

  • 1王海龙,王秀喜,王宇,梁海弋.金属Cu低指数表面熔化行为的分子动力学模拟[J].物理化学学报,2006,22(11):1367-1371. 被引量:1
  • 2Cotterill R M j 1980 J. Cryst. Growth 48 582.
  • 3Ubbelohde R 1965 Melting and Crystal Structure ( Oxford : Clarendon Press).
  • 4Foiles S M, Adams J B 1959 Phys. Rev. B 40 5909.
  • 5Pluis B, van der Gon A W D, Frenken J W M, van der Veen J F 1987 Phys. Rev. Lett. 59 2678.
  • 6Jeremy Q B, Leslie V W 1978 J. Phys. C 11 2743.
  • 7van der Con A W D, Smith R J, Gay J M 1990 Surf. Sci. 227 143.
  • 8Stoltze P, Norskov J K, Landman U 1988 Phys. Rev. Lett. 61 440.
  • 9Molenbroek A M, Frenken J W M 1994 Phys. Rev. B 50 11132.
  • 10Pluis B, Frenkel D, van der Veen J F 1990 Surf. Sci. 239 282.

共引文献46

同被引文献34

  • 1王海龙,王秀喜,梁海弋.应变效应对金属Cu表面熔化影响的分子动力学模拟[J].物理学报,2005,54(10):4836-4841. 被引量:7
  • 2周耐根,周浪,杜丹旭.面心立方晶体外延膜沉积生长中失配位错的结构与形成过程[J].物理学报,2006,55(1):372-377. 被引量:19
  • 3Faux D A,Gaynor G,Carson C L,et al.Computer Simulation Studies of the Growth of Strained Layers by Molecular-beam Epitaxy[J].Physical Review B,1990,42(5):2914.
  • 4Bernstein N,Aziz M J,Kaxiras E.Atomistic Simulations of Solid-phase Epitaxial Growth in Silicon[J].Physical Review B,2000,61(10):6696.
  • 5Rudawski N G,Jones K S,Gwilliam R.Stressed Solid-phase Epitaxial Growth of Ion-implanted Amorphous Silicon[J].Materials Science and Engineering:R:Reports,2008,61(1):40-58.
  • 6Lai H,Cea S M,Kennel H,et al.Molecular Dynamics Modeling of Solid Phase Epitaxial Regrowth[J].Journal of Applied Physics,2012,111(11):114504.
  • 7Tersoff J.Modeling Solid-state Chemistry:Interatomic Potentials for Multicomponent Systems[J].Physical Review B,1989,39(8):5566-5568.
  • 8Lutsko J F,Wolf D,Phillpot S R,et al.Molecular-dynamics Study of Lattice-defect-nucleated Melting in Metals Using an Embedded-atommethod Potential[J].Physical Review B,1989,40(5):2841.
  • 9Fujiwara K,Gotoh R,Yang X B,et al.Morphological Transformation of a Crystal-melt Interface during Unidirectional Growth of Silicon[J].Acta Materialia,2011,59(11):4700-4708.
  • 10李炜,陈俊芳,王腾,张洪宾,郭超峰.Si表面吸附GaN的第一性原理研究[J].材料导报,2009,23(16):71-73. 被引量:3

引证文献5

二级引证文献5

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部