摘要
微波器件的寿命往往取决于阴极的寿命,做好阴极寿命的测试是非常必要的。本文选择了常规寿命试验的方式,采用了阳控枪和水冷收集极的短管结构,在阴极工作温度1020℃、脉冲工作比10%、初始发射电流6A/cm2电流密度的状态下,进行行波管阴极寿命试验。截止目前,该试验还在进行中,累积寿命时间达8200h。
Generally, microwave device's life lies on its cathode^s life. It is very necessary to study the life of cathode. In this paper, the general life test method was adopted. The beam tube with anode-control gun and water-cooling collector works under 1020"C cathode temperature, current density of 6 A/cm2 and duty cycle of 10~. The life test is still in progress which has acuumulated 8200 h.
出处
《真空电子技术》
2013年第3期54-56,共3页
Vacuum Electronics