组合电路中延迟故障的功能测试生成

FUNCTIONAL TEST GENERATION FOR DELAYFAULTS IN COMBINATIONAL CIRCUITS

提出一种用于测试组合电路中延迟故障的新功能故障模型 ,讨论该模型的功能测试生成 .实验表明 ,这种功能测试集具有实现低路径延迟故障覆盖范围的功能 .

This paper proposes a functional fault for delay faults in combinational circuits and describes a functional test generation procedure based on this model. The experiments indicate that functional test sets may be able to identify functions whose realizations have low path delay fault coverage.