在通用自动测试仪上实现SPI存储器测试的方法研究

Research on methods for SPI memory test used by Universal ATE

近年SPI存储器已广泛用于各类电子产品和工业测控系统中，但SPI属于串行接口，难以使用算法图形产生器自动产生地址，因此难以在通用自动测试仪上进行测试。本文分析了SPI存储器的结构特点和测试难点，提出了一种基于并行转串行逻辑的SPI存储器算法图形自动产生的方法，并以SPIEEPROM芯片AT25HP512为例，实现了测试程序开发。实验证实，该方法可以克服SPI存储器地址算法自动产生的困难，对该类芯片测试具有通用性。

SPI memory has been widely used in many kinds of electronic products and industrial control systems in recent years.SPI is a kind of serial interface, so it is difficult to use the algorithm pattern generator to generate the address automatically by universal ATE.This paper analyzed the structural features and test difficulties of the SPI memory, and proposed a method of automatically generated algorithm pattern for SPI memory which is based on the parallel-to-serial logic.In addition, we took the SPI EEPILOM chip AT25HP512 as an example, realized the test program development. This paper confirmed that this method could overcome the algorithm automatically generated difficulties about SPI memory address and is applicable to the testing of such chips.