红外探测器非均匀性校正系统研制

Manufacture of nonuniformity correction system for infrared detector

分析了红外焦平面阵列(IRFPA)基于定标的非均匀性校正算法和基于场景的非均匀性校正算法的优势和不足。针对红外焦平面阵列二元非线性的非均匀性理论模型这一特点,提出了一种基于"S"曲线拟合的校正算法。利用FLIR公司的长波非制冷红外探测器进行信号采集,建立了焦平面探测元的响应模型。描述了基于FLIR长波非制冷红外探测器在FPGA平台的处理流程,并实现了"S"曲线校正算法,提高了红外图像的质量。实验表明,经过"S"曲线拟合校正处理,减弱了红外图像的条纹噪声,使IRFPA组件的非均匀性从6.45%降低至2.06%。

The advantages and disadvantages in nonu niformity correction （NUC） algorithms based oncalibration and scene of infrared focal plane arrays（IRFPA） were analyzed separately. Firstly, according tothe binary nonlinear nonuniformity theory model of IRFPA, a novel nonuniformity considering ＂S＂ curvecorrection method was proposed. Then, the original signal was captured using FLIR long-wavelength （8-14 microns） un-cooled infrared detector. And the response model of IRFPA was established. Thealgorithm flow based on FLIR long-wavelength un-cooled infrared detector with FPGA platform wasdescribed. The ＂S＂ curve correction method was implemented on the platform. By these ways, the wholeinfrared image quality was improved. The experimental results show that the fringe nonuniformity ofinfrared image is reduced after the ”S” curve correction and the nonuniformity of IRFPA module isdecreased from 6.45% to 2.06%.