Ba_2TiSi_2O_8晶体的质量表征及其性能研究

Quality Characterization and Performance of Ba_2TiSi_2O_8 Crystal

通过不断探索生长工艺及生长参数,采用提拉法成功生长了尺寸约为35 mm×35 mm×50 mm的Ba2TiSi2O8晶体,所得晶体均匀透明无开裂,用绿光激光笔照射,没有明显散射颗粒。表征了晶体质量,并对其透过光谱和室温偏振拉曼光谱性能进行了研究。采用高分辨X射线衍射技术对晶体的质量进行了表征,衍射峰较窄,没有劈裂,且分布对称,说明生长的晶体晶格完整、品质较好,能够满足晶体某些光学方面的需求。用分光光度计测量了晶体的室温透过光谱,晶体[100]方向和[001]方向上的透过率接近,在340～2500 nm范围内其透过率大约为84%,晶体的紫外透过截止波长为275 nm,高的透过率以及短的紫外透过截止波长,表明该晶体可能在光学方面有一定应用。采用共聚焦纤维拉曼光谱仪测量了晶体在背散射X(ZZ)X,X(YY)X,Z(XY)Z和X(YZ)X配置下的室温偏振拉曼光谱,并指认了某些测定的特征峰:662 cm-1属于桥对称伸缩振动νs(Si-O-Si),578,625,749,858,876 cm-1属于ν(Ti-O)振动,858,901,930,993和1022 cm-1属于ν(SiO3)振动。

Through exploring the growth process and parameters constantly, the Ba^TiSi2 0s single crystal, whose dimensions were a- bout 35 mm~ 35 mmx 50 mm, was successfully grown by the Czochralski method. The as-grown crystal was transparent and without cracking, no obvious scattering particles were found by a laser pen irradiation. The crystal quality was characterized, and the transmis- sion spectrum and the room temperature polarized Raman spectrum were studied. The crystal quality was characterized by high-resolu- tion X-ray diffraction（XRD）, the diffraction peak with no split was relatively narrow and symmetric distribution. The results showed that the as-grown crystal had highly perfect lattice structure and good quality, which could meet the need of some optic applications. The room temperature transmission spectrum was measured by spectrophotometer, the photograph showed that the transmittance of [ 100 ] direction was similar with the transmittance of [ 001 ] direction. The transmittance in the wavelength range of 340 - 2500 nm was about 84%, and the cutoff transparency wavelength was 275 nm. The high transmittance and short cutoff transparency wavelength indicated that the crystal could be applied in optics. The room temperature polarized Raman spectrum were performed in back scatter