基于APSIM的旱地小麦叶面积指数模拟模型构建

Modeling of APSIM-based simulation of leaf area index of wheat in dryland

为了解旱地小麦叶片生长规律，建立基于APSIM的小麦叶面积潜在生长率模型和叶面积水、氮协同生长率模型，并在田间试验修订参数的基础上，连接到APSIM平台，模拟小麦叶面积指数动态变化过程，采用相关性分析方法定量分析小麦叶面积指数的变化规律。结果表明：基于APSIM的小麦叶面积潜在生长率模型和叶面积水、氮协同生长率模型对旱地小麦生长指标叫的模拟有较高精度。小麦全生育期内叶面积指数模拟值与实测值呈显著正相关，相关系数（R）为0．996，归一化均方根误差（NRMSE）范围在3．08％～9．38％，模型有效性指数（ME）为0．594～0．956，均大于0．5。

In order to understand the gyowth law of leaves of wheat in dryland, the APSIM-based model of leaf area potential growth and the leaf area growth model regarding to water and nitrogen stress were built. The parameters of AP- SIM were modified and verified according to the data collected from the field experiment, and the dynamic process of leaf area index （LAD during the growth period of wheat was simulated by connecting the models to APSIM-Wheat. Further-more, the change law of LAI of wheat was explored by using correlation analysis method. The results showed that the APSIM-based model of leaf area potential growth and the leaf area growth model regarding to water and nitrogen stress could be used to simulate the dynamic process of LAI of wheat with a high accuracy. During the whole growth period of wheat, the simulated and observed LAI values were positively correlated （ R = 0. 996）, with the normalized root mean square error （NRMSE） within 3.08 % - 9.38 % and the effectiveness index （ME） within 0. 594 - 0. 956.