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10-Bit Single-Slope ADC with Error Calibration for TDI CMOS Image Sensor

10-Bit Single-Slope ADC with Error Calibration for TDI CMOS Image Sensor
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摘要 A 10-bit single-slope analog-to-digital converter (ADC) for time-delay-integration CMOS image sensor was proposed. A programmable ramp generator was applied to accomplish the error calibration and improve the linearity. The ADC was fabricated in a 180 nm 1P4M CMOS process. Experimental results indicate that the differential nonlinearity and integral nonlinearity were 0.51/-0.53 LSB and 0.63/-0.71 LSB, respectively. The sampling rate of the ADC was 32 kHz. A 10-bit single-slope analog-to-digital converter （ADC） for time-delay-integration CMOS image sensor was proposed. A programmable ramp generator was applied to accomplish the error calibration and improve the linear- ity. The ADC was fabricated in a 180 nm 1P4M CMOS process. Experimental results indicate that the differential nonlinearity and integral nonlinearity were 0.51/-0.53 LSB and 0.63/-0.71 LSB, respectively. The sampling rate of the ADC was 32 kHz.
作者 高岑 姚素英 杨志勋 高静 徐江涛
机构地区 School of Electronic Information Engineering
出处 《Transactions of Tianjin University》 EI CAS 2013年第4期300-306,共7页 天津大学学报（英文版）
基金 Supported by National Natural Science Foundation of China (No. 61036004 and No. 61076024)
关键词 CMOS图像传感器 误差校正 ADC 单斜 TDI 数字转换器 积分非线性 微分非线性 single-slope ADC error calibration CMOS image sensor
分类号 TP212 [自动化与计算机技术—检测技术与自动化装置] TN792 [电子电信—电路与系统]
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参考文献15

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Transactions of Tianjin University
2013年 第4期

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