应用小型X射线荧光光谱仪快速测定钾长石的化学成份

Rapid Measurement of Chemical Components of Potassium Feldspar by Small-Size X-Ray Fluorescence Spectrometer

本文采用粉末压片法制样 ,用小型多道波长色散 X射线荧光光谱仪测定钾长石中的 Si O2 、Al2 O3、Ca O、Mg O、Fe2 O3、K2 O、Na2 O。测定准确度、精密度较好 ,所得结果满足化学分析误差要求 ,能完全替代化学分析 ,将一个钾长石作全分析整个过程只需 30 min。本法快速、简便 ,结果令人满意。

The sample was prepared by the method of powder compressing.By the small size multichannel simultaneous X ray fluorescence spectrometer,the contens of SiO 2,Al 2O 3,CaO,MgO,Fe 2O 3 and K 2O,Na 2O in potassium feldspar can be measured.With high accuracy,this measuring method can reach the tolerance error demanded by chemical analysis.Using this method,a complete analysis for potassium feldspar only needs 30 minutes.Therefore,common chemical analysis ways can be replaced by this method completely.