摘要
提出了一种LS-RAID(Logic-level Striping Redundant Array of Independent Disks)固态盘(Solid State Disk,SSD)设计模型。在单个闪存芯片内,该模型在逻辑层实现了条带化,并将校验信息按照RAID5机制分配到逻辑闪存芯片中,从而提高了固态盘可靠性。使用DiskSim进行仿真测试,表明该模型在提高可靠性的同时,对固态盘平均寿命和损耗均衡影响不大,具有实用价值。
We propose a design model of Logic-level Striping Redundant Array of Independent Disks. In a single flash chip, the model implements striping in logic-level and assigns the parity information to the logic flash memory chips according to the RAID5 mechanism. It aims to improve SSD reliability. Here we use DiskSim to estimate the design model. Simulation results and their analysis show preliminarily that the reliability of SSD is indeed improved at the cost of a little effect on the average life of the SSD and the wear leveling.
出处
《西北工业大学学报》
EI
CAS
CSCD
北大核心
2013年第4期660-663,共4页
Journal of Northwestern Polytechnical University
基金
航空科学基金(2012ZC53040)
西北工业大学2011届本科生毕业设计重点扶持项目资助
关键词
校验信息
固态盘
条带化
可靠性
computer simulation, computer software, design, estimation, flash memory, mathematical models, microprocessor chips, NAND circuits, reliability analysis
LS-RAID（ Logic-level Striping Redundant Array of Independent Disks）, parity information, solid state disk（SSD）
