TFT-LCD产品开机边缘白化现象研究

Edge Albino in Turn-on TFT-LCD

通过对TFT-LCD开机状态的测试,分析了TFT-LCD开机边缘白化现象的发生机制,提出了改善TFT-LCD开机边缘白化现象的方法。分析表明TFT-LCD开机边缘白化现象的根源在于开机时边缘感应电场的干扰使靠近面板边缘两侧的液晶分子发生旋转而漏光。液晶盒内表面的形貌影响感应电荷的淤积状态和液晶分子的取向,黑矩阵材料的阻抗影响感应电荷向显示区的扩散程度。进行了TFT-LCD开机边缘白化现象的改善实验,试验结果表明,通过减少栅极引线、增加感应电荷的屏蔽层、使用高阻抗的BM材料、增大栅极引线与显示区的距离等方法可以有效解决边缘白化现象。

The mechanism of Edge Albino with starting up is investigated by checking of powering on status, and improving methods are demonstrated. The results of analysis show that root cause of Edge Albino comes from interference of electric field which induces LC molecule switch and light leakage. The inter-surface profile of edge area influences on distri- bution of electric charge and LC molecule alignment, BM resistance impacts spread of in- duced electric charge. The paper presents relevant experiments for countermeasure. Experi- mental results show that some methods can solve the problem of edge albino, including de- creasing outer gate lines, adding shield layer of induced charge, using high resistance BM material, as well as enlarging distance between gate line and active area. The mechanism of edge albino and countermeasure is investigated in detail.