光电经纬仪机架温度变形分析

Temperature Deformation Analysis of Photo-electronic Theodolite Mechanical Structure

为了分析光电经纬仪机架的温度变形,建立了经纬仪机架结构的三维模型,利用Ansys/Workbench有限元分析软件对整机机架进行了稳态热分析。给出了机架温度场分布、机架总体变形以及沿Z轴方向的变形情况。通过仿真结果与实验对比分析表明,光电经纬仪机架在太阳照射不均匀及环境温度变化条件下,局部会发生较大变形。机架结构在27.938℃时的最大变形为0.133mm,左右立柱变形造成水平轴倾斜2.8″,机架变形会降低经纬仪的指向精度。这些分析为下一步机架结构优化设计、温度传感器布点及局部温度控制提供了参考信息。

To analyze the temperature deformation of photo-electronic theodolite mechanical structure,the entity model of theodolite mechanical structure was established,and stable-state thermal analysis of mechanical structure was done by using the software Ansys/Workbench.Moreover,the temperature distribution of mechanical structure,temperature deformation of mechanical structure and the temperature deformation of mechanical structure along Z direction were given.The analysis shows that part of the mechanical structure has a greater deformation under the conditions of thermal inhomogeneity and temperature changes.At 27.938℃,the maximum deformation of mechanical structure is 0.133 mm,the deformation of columns causes horizontal axis inclined 2.8″,and deformation reduces pointing accuracy of theodolite.The analysis provides reference information for structure optimization design,distribution of temperature sensor and local temperature control of photo-electronic theodolite.