摘要
以20钢含V型缺陷平板试样为研究对象,通过试验方法和ANSYS仿真方法对试样在拉伸载荷下的应力分布进行反复加载卸载分析,测量了试样表面规定路径的切向和法向的漏磁场分布;分析了V型缺陷对磁记忆信号的影响以及固定位置的磁场值随应力的变化关系;最后将试验结果与模拟结果进行对比,发现试验结果与模拟结果具有很好的一致性。在应力小于50MPa时磁场值随应力的增加而减小,在应力大于50MPa时磁场值随应力的增加而增加。变化关系表现出了明显的应力磁化反转现象,磁化反转位置在50MPa(约是最大应力的30%)。
For 20 steel with V-type defects plate, experimental analysis of repeated loading and unloading the speci- men was rendered under tensile load stress distribution through the test and ANSYS simulation method. The mag- netic leakage field distribution on tlae surface of sample was measured in the tangential and normal of the set path. The effect of V-shaped defects on the magnetic memory signals, as well as the relationship between the magnetic field values of fixed positions with stress was analyzed. Finally, experimental results and simulation results were compared and were in good agreement with each other. The magnetic field value decreases with increase in stress when the stress is less than 50 MPa. The magnetic field value increases with increase in stress when the stress is higher than 50 MPa. The obvious phenomenon of stress magnetization reversal was present, and the magnetization reversal position is about 50MPa (about 30% of the maximum stress).
出处
《钢铁研究学报》
CAS
CSCD
北大核心
2013年第3期30-33,共4页
Journal of Iron and Steel Research
基金
国家自然科学基金资助项目(51261023)
关键词
静拉伸
磁记忆检测
力磁效应
磁化反转
static tensile
magnetic memory test
stress-magnetization effect
magnetization reversal