摘要
目的 :探讨不同类型弱视在视网膜水平的改变。方法 :对 4种类型的弱视儿童 86例分别进行V -EOG测试 ,并与正常对照组进行比较分析。结果 :形觉剥夺性弱视组的光峰电位、电势差值和Arden比明显偏高 ;屈光参差性弱视组光峰电位偏低 ,光峰时间延长 ;屈光不正性弱视组中 ,近视屈光状态者暗谷电位增大 ,Arden比与Gliem比偏低 ,远视屈光状态者则无明显变化 ;斜视性弱视组各参数未见明显差异。结论 :提示在视网膜水平不同类型的弱视可能存在不同的发病机理。
Objective:To investigate the changes of 4 types of amblyopia on retina level.Methods:Visual electrooculogram (V-EOG) was performed to 4 types children with amblyopia respectively. The parameters were compared with the normal control group. Results:Light peak (LP), potential difference (PD) and Arden ratio appeared significant increase in deprivation amblyopia. In anisometropic amblyopia, the value of LP decreased and the light peak time (LPT) prolonged. V-EOG did not show significant changes in strabismic amblyopia. Among the ametropic amblyopia, the hypermetropia eyes showed no significant change, but the myopia eyes showed dark potential (DP) increased and the Arden ratio together as well as Gliem ratio decreased. Conclusion:This work indicated that the results of V-EOG in amblyopia should be carefully considered according to different types of amblyopia, since different types of amblyopia might be subjected to different pathogenic mechanisms on retina level.
出处
《内蒙古医学院学报》
2000年第3期157-159,共3页
Acta Academiae Medicinae Neimongol
基金
国家自然科学基金资助!(基金编号No .39670 774)
