联合谱域与深度域光谱相位显微方法

Joint spectral and depth domain spectral domain phase microscopy

提出了一种联合谱域与深度域光谱相位显微方法,该方法利用谱域相位信息克服2π歧义,并结合深度域相位信息,以实现高动态范围、高灵敏度的相位检测.首先通过理论推导和信号模拟,进行了深度域相位和谱域相位的灵敏度比较,证明了深度域相位在灵敏度上要高于谱域相位.进而详细介绍了联合谱域与深度域光谱相位显微方法.最后通过盖玻片和光学分辨率板实验验证了所提出的联合谱域与深度域光谱相位显微方法能够在实现高动态测量范围的同时保持高相位灵敏度.

We present a joint spectral and depth domain spectral domain phase microscopy for high-sensitive and high-dynamic-range quantitative phase imaging, where phase information retrieved in spectral domain is used to overcome the limitation of 2π ambiguity and phase information in depth domain is used to achieve a high phase sensitivity. By theoretical derivation and simulation, the sensitivity advantage of phase information in depth domain over phase information in spectral domain is investigated. The theoretical derivation of joint spectral and depth domain spectral domain phase microscopy is presented in detail. The performance of the proposed joint spectral and depth domain spectral domain phase microscopy is illustrated by phase imaging of a coverslip and a resolution target.