SF_6气体绝缘高压设备颗粒陷阱综述

Review of Particle Trap in SF_6 Gas Insulated Apparatus

以SF6气体作为绝缘气体的电气设备都存在一个共同的问题,即这些GIS/GIL设备在设备的生产制造环节以及设备运行过程中会产生一定的金属颗粒,带电颗粒受到电场力的作用会在设备中运动或附着在绝缘子和电极表面上而导致内外电极间的击穿或闪络,而降低设备的绝缘性能。所以在GIS/GIL设备内部需要安装一些减少金属颗粒对绝缘性能影响的结构,其中颗粒陷阱(particle trap)就是其中之一,笔者通过对多年来的相关文献的阅读研究,总结了为了减少粒子的影响各个公司及研究人员所做的各种研究工作,分别介绍了美国西屋电力公司申请的专利及用于限制颗粒运动的其他专利,引用其他研究人员的计算结果分析了这些专利的理论依据。

All SF6 insulated apparatuses face a common problem, i.e. metal particles will be produced inside the GIS or GIL apparatuses in the processes of manufacturing and operation. Under the action of coulomb force in electric field, the particles will move in the apparatuses or adhere to insulators and electrodes to cause breakdown or flashover between inner electrode and enclosure,thus to lower the insulation performance of the equipment. Therefore, it is necessary to set some devices, such as particle trap ,to reduce the effect of the metal particles on the insulation performance of the equipment. This paper sums up the researches on weakening the particles＇ effect, introduces the patent of Westinghouse Electric Corporation and other relevant patents for deactivating the particles, and analyzes the theoretical bases of these patents by making use of the researches in literature.