期刊文献+

电子背散射衍射试样的制备技术 被引量:6

Preparation of Sample for Electron Backscattered Diffraction
下载PDF
导出
摘要 电子背散射衍射试样的制备质量对其成像效果有重要的影响。电子背散射衍射试样的制备方法已由传统的机械抛光、机械-化学抛光和电解抛光发展到离子减薄、聚焦离子束和最新的截面抛光等。介绍了工业纯铁和PbTiO_3微米粉末电子背散射衍射试样的制备方法。 The preparation quality of electron backscatter diffraction ( EBSD ) sample will exert a significant influence on the imaging effect .The methods of preparing EBSD sample have developed from conventional mechanical , mechanical-chemical and electrolytic polishings to ion thinning , focused ion-beam and cross section polishing .The examples of preparing EBSD samples of pure iron and micro-level PbTiO 3 powder were introduced .
出处 《热处理》 CAS 2013年第4期71-74,共4页 Heat Treatment
关键词 电子背散射衍射 试样制备 机械 化学抛光 电解抛光 EBSD sample preparation chemical-mechanical polishing electrolytic polishing
  • 相关文献

参考文献6

  • 1Dingley D J, Baba-Kishi K Z, Randle V. Atlas of back scattering kikuchi diffraction patterns [ M ]. Bristol: Institute of Physics Publishing, 1995.
  • 2Adam J S, Mukul K, Brent L A. Elecrton backscatter diffraction in materials science [ M ]. New York: Kluwer Academic/Plenum Publishers, 2001.
  • 3Dingley D J. A comparison of diffraction tecniques for SEM[ J ]. Scanning Electron Micro Scopy, 1981 (1V) :273-286.
  • 4高峰,海超.电子背散射衍射在钢铁材料领域的应用[J].本钢技术,2001(5):8-11. 被引量:7
  • 5李华清,谢水生,阎允杰,李旭东.取向成像电子显微术试样的制备[J].理化检验(物理分册),2004,40(12):612-615. 被引量:17
  • 6屠世润,高越.金相原理与时间[M].北京:机械工业出版社.1990.

二级参考文献9

  • 1Adams B L, Wright S I, et al. Orientation Imaging: The Emergence of a New Microscopy [J]. Meta Tran, 1993,24A:819-831.
  • 2Cannon H S. A Universal Polishing Method[J]. Met Prog, 1955,67:83-86.
  • 3Balasundaram A, Gokhale A M. Quantitative Characterization of Spatial Arrangement of Shrinkage and Gas (Air) Pores in Cast Magnesium Alloys[J]. Materials Characterization, 2001,46:419-426.
  • 4Adams B L. Orientation Imaging Microscopy: Emerging and Future Applications[J]. Ultramicroscopy, 1997,67:11-17.
  • 5Humphreys F J. Review Grain and Subgrain Characterisation by Electron Backscatter Diffraction[J]. Journal of Science, 2001,36:3833-3854.
  • 6David P Field, David J Dingley. Microstructure Mapping of Interconnects by Orientation Imaging Microscopy [J]. Journal of Mlectronic Material, 1996,25:1767-1771.
  • 7Angus J Wilkinson. A New Method for Determining Small Misorientation from Electron Back Scatter Diffraction Patterns[J]. Scripta Mater, 2001,44:2379-2385.
  • 8David P Field, David J Dingley. Microstructure Mapping of Interconnects by Orientation Imaging Microscopy[J]. Journal of Mlectronic Material, 1996,25:1767-1771.
  • 9Dorte J Jensen. Applications of Orientation Mapping by Scanning and Transmission Electron Microscopy [J]. Ultramicroscopy, 1997,67:25-34.

共引文献22

同被引文献62

引证文献6

二级引证文献17

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部