可测试性设计中的优化问题及求解算法

Optimization Problems and their Solving Algorithm in DFT

近20年来,为了解决结构日益复杂的VLSI电路的测试问题,可测试性设计技术得到了迅速发展.在可测试性设计中,如何针对不同的对象及测试需求进行优化设计,以尽可能降低总体设计代价,是一个非常重要且亟待解决的问题.文章应用图论对可测试性设计中的两种典型优化问题进行了数学描述,并构造了相应的可行求解算法.

： In the last 20 years,in order to solve the difficulties in electronic system test,a new technology called DFT(Design for Testability) have achieved great development.In DFT,one important and emergent problem is to minimize the design cost while satisfying the test requirements,i．e．,to achieve optimal design.In this paper,based on topology theory,two effective algorithms are given with illustration examples,which can solve two typical optimization problems in DFT．