集成电路测试程序的可测性设计

Desiging for Testability of IC Test Program

本文系统地提出集成电路测试程序的可测性设计的概念和方法.阐述了可测性设计在测试程序设计中的重要地位,指出测试程序的可测性设计给测试程序的质量控制、评估验证独辟蹊径,进一步提高了测试程序的可靠性.

This paper which advances a conception and method of the testability design of IC test program analyses its significant position in test programming and pointing out that of test program developes a new way of its own in quality control and evaluation of test program, the reliability of test program will be further improved.