摘要
将工厂试验数据作为先验信息,应用Bayes方法确定电子元件高温贮存试验的试样数量,其结果明显少于GJB 345A—2005中规定的试样数量。基于不同试验结果,通过构建寿命模型和确定先验分布,分别得到了电子元件的寿命分布和失效概率的Bayes估计。
Based on the factory test data,the samples of electronic component high temperature storage test were determined based on Bayes,which are less than the samples defined by GJB345A-2005.The lifetime distribution of electronic component and the Bayes estimation of failure probability were obtained by structuring lifetime model and determining prior distribution based on the different test results.
出处
《装备环境工程》
CAS
2013年第4期20-22,46,共4页
Equipment Environmental Engineering
关键词
电子元件
高温贮存试验
加速寿命试验
无失效数据
BAYES估计
electronic component
high temperature storage test
accelerated life test
zero-failure data
Bayes estimation
