基于qPlus技术的扫描探针显微学研究进展

Research progress of qPlus scanning probe technique

不同于扫描隧道显微镜(scanning tunneling microscope,STM),原子力显微镜(atomic force microscope,AFM)主要通过探测针尖和样品间的相互作用力获得样品表面信息,不需要导电的样品,可以研究比STM更为广泛的样品体系,自发明以来迅速成为基础科学和应用研究领域中一种强有力的工具.近几年发展起来的基于qPlus技术的非接触式原子力显微镜(qPlus-noncontact AFM,qPlus-NC-AFM),通过关键部件原子力传感器的改进,进一步拓展了原子力显微镜的探测能力,从而在许多研究方向上取得了重要突破.本文介绍了qPlus-AFM的基本工作原理及其在基础科学研究领域中的最新研究进展,并对其进一步的发展进行了展望.

Compared with scanning tunneling microscopy （STM）, atomic force microscopy （AFM） can be used to investigate both conductive and non-conductive samples through measuring the interaction forces between the atomic force sensor and the sample surface. In the past few years, the performance of AFM has been greatly improved after the invention of qPIus-AFM with the latest qPlus tuning fork based atomic force sensor. In this review, we give a brief introduction to the qPlus technique and the latest research progress of qPlus-AFM based AFM. Some comments on the future development of qPlus probe technique are also given.