^(75)Se和^(113)Sn的KX射线发射几率测量

Measurements of the KX-ray Emission Probabilities of ^(75)Se and ^(113)Sn

用54 Mn、57Co、6 5Zn、85Sr、10 9Cd、137Cs等核素发射的KX射线和I(KX) /I(γ)比值法在 5～ 4 0keV范围内对Si(Li)探测器的效率进行了刻度 (不确定度小于 2 % )。在此基础上 ,用Si(Li)X射线谱仪系统和HPGeγ射线谱仪系统对核素75Se和113Sn的主γ射线和KX射线进行了测量 ,获得了75Se和113Sn的KX射线发射几率 。

Si(Li) detector efficiency in 5～40 keV is calibrated with the KX ray emitted from the calibration sources, 54 Mn, 57 Co, 65 Zn, 85 Sr, 109 Cd, 137 Cs and the I (KX)/ I (γ) method. Uncertainty of the efficiency is less than 2 %. The KX ray emission probabilities of 75 Se and 113 Sn are measured using the Si(Li) detector. The measurement results are compared with the recommended values from CRP IAEA and other measurements.