摘要
High-pressure behavior of tetramethylsilane is investigated by synchrotron powder X-ray diffraction and Raman scattering at pressures up to 30 GPa and room temperature. Our results reveal the analogous phase transitions, though slight hysteresis for the certain phases. A new phase is found to appear at 4.2 GPa due to the disappeared Raman mode. These findings offer the possibility to understand the evolution of the H-H bonding with pressure in such hydrogen-rich compounds.
High-pressure behavior of tetramethylsilane is investigated by synchrotron powder X-ray diffraction and Raman scattering at pressures up to 30 GPa and room temperature. Our results reveal the analogous phase transitions, though slight hysteresis for the certain phases. A new phase is found to appear at 4.2 GPa due to the disappeared Raman mode. These findings offer the possibility to understand the evolution of the H-H bonding with pressure in such hydrogen-rich compounds.
基金
Supported by Cultivation Fund of the Key Scientific and Technical Innovation Project Ministry of Education of China(708070)
Fundamental Research Funds for Central Universities SCUT(2012zz0078)
Guangdong Natural Science Foundation(S2012040007929)
supported by the U.S. Department of Energy,Ofce of Science,Ofce of Basic Energy Sciences,under Contract No. DE-AC02-98CH10886
