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A 10-bit column-parallel cyclic ADC for high-speed CMOS image sensors 被引量：2

A 10-bit column-parallel cyclic ADC for high-speed CMOS image sensors
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摘要 This paper presents a high-speed column-parallel cyclic analog-to-digital converter（ADC） for a CMOS image sensor.A correlated double sampling（CDS） circuit is integrated in the ADC,which avoids a stand-alone CDS circuit block.An offset cancellation technique is also introduced,which reduces the column fixed-pattern noise（FPN） effectively.One single channel ADC with an area less than 0.02 mm^2 was implemented in a 0.13μm CMOS image sensor process.The resolution of the proposed ADC is 10-bit,and the conversion rate is 1.6 MS/s. The measured differential nonlinearity and integral nonlinearity are 0.89 LSB and 6.2 LSB together with CDS, respectively.The power consumption from 3.3 V supply is only 0.66 mW.An array of 48 10-bit column-parallel cyclic ADCs was integrated into an array of CMOS image sensor pixels.The measured results indicated that the ADC circuit is suitable for high-speed CMOS image sensors. This paper presents a high-speed column-parallel cyclic analog-to-digital converter（ADC） for a CMOS image sensor.A correlated double sampling（CDS） circuit is integrated in the ADC,which avoids a stand-alone CDS circuit block.An offset cancellation technique is also introduced,which reduces the column fixed-pattern noise（FPN） effectively.One single channel ADC with an area less than 0.02 mm^2 was implemented in a 0.13μm CMOS image sensor process.The resolution of the proposed ADC is 10-bit,and the conversion rate is 1.6 MS/s. The measured differential nonlinearity and integral nonlinearity are 0.89 LSB and 6.2 LSB together with CDS, respectively.The power consumption from 3.3 V supply is only 0.66 mW.An array of 48 10-bit column-parallel cyclic ADCs was integrated into an array of CMOS image sensor pixels.The measured results indicated that the ADC circuit is suitable for high-speed CMOS image sensors.
作者 韩烨 李全良 石匆 吴南健
机构地区 State Key Laboratory of Superlattices and Microstructures
出处 《Journal of Semiconductors》 EI CAS CSCD 2013年第8期177-182,共6页 半导体学报（英文版）
基金 supported by the National Natural Science Foundation of China(Nos.60976023,61234003) the Special Funds for Major State Basic Research Project of China(No.2011CB932902)
关键词 CMOS image sensor column-parallel cyclic ADC correlated double sampling offset cancellation CMOS image sensor column-parallel cyclic ADC correlated double sampling offset cancellation
分类号 TN792 [电子电信—电路与系统] TP212 [自动化与计算机技术—检测技术与自动化装置]
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参考文献13

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同被引文献14

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Journal of Semiconductors
2013年 第8期

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