摘要
By proportional differentiating cumulative distribution function of normal distribution,the spectroscopy characteristics are found.The characteristic parameters can be extracted directly from the height and position of the spectroscopy peaks.On this basis,a new method for determining these parameters of normal distribution is developed.This method can be applied to microelectronics reliability study.
By proportional differentiating cumulative distribution function of normal distribution,the spectroscopy characteristics are found.The characteristic parameters can be extracted directly from the height and position of the spectroscopy peaks.On this basis,a new method for determining these parameters of normal distribution is developed.This method can be applied to microelectronics reliability study.
关键词
正交分布
可靠性
PDO
比例差估计
normal distribution
PDO
proportional difference estimate
reliability
