摘要
研究了折射率n与电子数浓度Ne及高度h之间的关系,并通过数值模拟对电子数浓度的高度剖面和折射率随高度的变化规律进行了分析.将模拟和实际观测出的频高图进行对比,发现在高电离层模拟值与实际值较相近,在低电离层则由于非线性关系及Es层存在的效应,模拟值与实际值有较大的误差.
Refraction is the main characteristic when electromagnetic wave propagates through ionosphere ,which is mainly determined by the free electrons in ionosphere. In this paper the relationship between the refractive index (n) , the electron concentration(N~ ) and the altitude (h) is analyzed, and numerical simulations are taken on the refractive index and the electron concentration relating to the altitude. We contrast the simulated altitudinal profile of critical frequency and the actual altitudinal profile of critical frequency, and the results show that at high iono- sphere, the simulations are roughly in agreement with the actual measurements, while at the lower ionosphere the simulations deviate from the measurements by reason of nonlinear relationship and existence of E layer.
出处
《南京信息工程大学学报(自然科学版)》
CAS
2013年第4期379-384,共6页
Journal of Nanjing University of Information Science & Technology(Natural Science Edition)
基金
国家自然科学基金(11105075)
关键词
电磁波
电离层
折射率
电子数浓度
数值模拟
electromagnetic wave
ionosphere
refractive index
electron concentration
numerical simulations