含硼涂层的电子探针分析

Electron Probe Microanalysis of Boron Containing Coating

元素硼在电子探针分析中属超轻元素,其定量分析的准确性受多种因素制约,很难满足材料分析的要求。本工作用电子探针分析了钼基合金上一种加硼的Si-Ti复合涂层。着重解决了Mo的M系谱线对BK_α射线的谱线干拢及质量吸收系数不准确等问题,较准确地测定了各层中元素的含量,特别是硼的含量及分布。并用面扫描显示了含硼与不含硼涂层氧化后的形貌及元素分布,较好地解释了两个含硼层对改善抗热震性能的作用。

Boron is the lightest element which can be analysed by electron microprobe. There are a lot of factors con- cerning in the quantitative accuracy of ultralight element analysis. In the present work a complex coating con-taining boron was analysed by EPMA. Emphsis was laid to solve the interference of Mo line and other high or-der lines with the Boron K_α line and the unaccuracy of mass absorption coefficient. The composition of each lay-er of the coating was detemined accuratly. Whereby the mechanism of the excellent thermal shock resistance ofthe coating could reasonably be explained.