摘要
本文用全域寻优算法探索了器件参数提取,因为软件方法比用硬件方法有利,所以偏重于软件。文中以CaAs MESFET器件参数提取为例,验证了全域寻优算法,同时也解决了器件参数提取中解的唯一性问题。
The device parameter extraction is studied by means of global optimization in thrs paperr. The method depends largely upon software and has more advantages than using hardware. Take the device parameter extraction of GaAs MESFET for example, the global optimization is verified and the problem of its solution uniqueness is solved as well.
出处
《电子学报》
EI
CAS
CSCD
北大核心
1991年第3期84-88,96,共6页
Acta Electronica Sinica
基金
国家科技攻关项目
