高效容错可逆的汉明码编码和检测电路

Efficient fault tolerant reversible Hamming code encoding and detection circuits

为了检验传输过程中数据的可靠性，设计了容错可逆的汉明码电路。提出了一种新型的可逆逻辑门（FVG），并且完成了FVG门等价的量子实现。利用FVG门和现有的容错可逆门，实现了汉明码编码电路和检测电路。以（7，4）汉明码设计为实例，根据量子代价和延迟对其进行性能评估，结果证明该电路比现有电路的性能提高10％-20％，仿真实验结果显示，电路逻辑结构正确，性能可靠。

The fault tolerant reversible Hamming code circuits were designed in order to test the reliability of the data in the transmission process. A new reversible gate named four variables parity preserving gate （FVG） was proposed, and the quantum equivalent implementations of FVG was also given. Fault tolerant reversible code encoding and detection circuits were designed using FVG and existing gates. Taking the design of the （7, 4） Hamming code as an example, its circuit performance was evaluated in terms of quantum cost and delay. The results prove that its performance is improved by 10% to 20% than existing counterparts Simulation results indicate that the logic structures of circuit are correct and their performances are reliable